The Electron Microscope Division provides technologically advanced solutions to diverse and complex challenges in the various fields of research and manufacturing. For more than three decades our goal has been to provide customers with more powerful, highly efficient, dependable and easy-to-use microscope solutions for their scientific instrument needs. We support thousands of satisfied customers with a wide range of reliability-proven instrumentation, including SEM, TEM, Dedicated STEM, FIB, CD-SEM, DF Wafer Inspection System and Defect Review SEM.