Electron Microscopes and Focused Ion Beam
The Nanotechnology Systems Division (NSD) provides technologically advanced solutions to meet the diverse and complex challenges of materials science, biological research, and industrial manufacturing. We support our satisfied customers with a wide range of reliability-proven instrumentation, including scanning electron microscopy (SEM), analytical and biological transmission electron microscopy (TEM), dedicated STEM, Focused Ion Beam (FIB), tabletop microscopes, and microanalysis sample preparation systems.
03/25/2014 to 03/27/2014Mandalay Bay Convention Center - Las Vegas, Nevada
03/26/2014Clemson University ICAR, Greenville, SC
04/26/2014 to 04/27/2014Washington DC
05/06/2014 to 05/08/2014Clarksburg, MD