 | | FB-2100 FIB System |
Overview
- Accelerating Voltage 10kV - 40kV
- High Current Density ~ 30 nA
- In-Situ Lift Out Microsampling
- Built-in Scanning Ion Microscope (SIM) Imaging Capabilities with Resolution Less Than or Equal to 6nm
The FB-2100 Focused Ion Beam System offers significant benefits over conventional ion beam milling systems, including built-in imaging capabilities and sample handling compatibility with Hitachi's HF-3000 TEM, HF-2200 TEM, S-5500 SEM and the HD-2000.