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starting of breadcrumb Electron Microscope Division  > Products > Electron Microscopes > Field Emission SEM > S-4300 Cold FE-SEMending of breadcrumb
 

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S-4300 Cold FE-SEM

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S-4300 Cold FE-SEM

 
Overview
Specifications


Product Number:S-4300 CFE

 
 

Overview

 
  • Entry Level High Resolution CFE SEM
  • Familiar Windows XP Operating System
  • Proven Cold Field Emission Gun and Vacuum Technology
  • Specimen Exchange Chamber Provides High Throughput
  • Robinson BSED Provided as Standard

The S-4300 continues the Hitachi tradition of setting the standard for high resolution imaging as well as unparalled uptime. Over 25 years of cold cathode field emission design experience has been incorporated into a robust imaging and analytical tool that can be utilized by SEM users of all skill levels. The S-4300’s chamber design enhances versatility of the SEM by the addition of a variety of accessories such as a cryogenic stage or an EBIC imaging system. In short, the S-4300 CFE SEM provides the user with powerful imaging and analytical capabilities in one easy to use low cost package.

 
 
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