 | | Focused Ion Beam System |
Hitachi's Focused Ion Beam (FIB) systems deliver quick and accurate sample preparation that is far superior to conventional techniques. Available with either a Hitachi SEM or TEM stage, the FIB allows the use of compatible holders for both specimen preparation and subsequent TEM or SEM observation in the tool of choice. Additionally, Hitachi's patented Microsampling System provides users with unmatched in-situ liftout capabilities that greatly increase throughput.
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