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starting of breadcrumb Electron Microscope Division  > Products > Electron Microscopes > Standard and Variable Pressure SEM > S-3400N Fully Automated VP SEMending of breadcrumb
 

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S-3400N Fully Automated VP SEM

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S-3400N Fully Automated VP SEM

 
Overview
System Specifications


Product Number:S-3400N

 
 

System Specifications

 
Resolution 3.0nm High Vacuum Mode; 4.0nm Variable Pressure Mode
Detectors SE and BSE (solid state, TV rate observation)
Chamber Accommodates 10 inch specimen; Three high TOA ports for EDS, WDS, EBSP, XRF, etc.
StageFully eucentric, 5 axis computer controlled mororized stage
Electron GunVariable Quad Bias Circuitry with SE Accelerator Plate
AutomationFull automation including "no touch" objective aperture alignment
VacuumTurbo Molecular Pump (TMP)
 
 
 
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