skip header  Back to Hitachi-HTA Home
   Product Finder    Global Network Global Site

site name(Site name)go HITACHI xxxx Home


starting of primary navigation |  Home  |   Products  |   Tech Notes  |  Press  |  Events  |  Service and Support  |  ending of primary navigation

Search
Go

 > advanced search
starting of main content

starting of breadcrumb Electron Microscope Division  > Products > Electron Microscopes > Field Emission SEM > S-4300 SE/N FE SEMending of breadcrumb
 

page title

S-4300 SE/N Variable Pressure FE SEM

printable version


 
 

S-4300 SE/N Variable Pressure FE SEM

 
Overview
System Specifications


Product Number:S-4300 SE/N

 
 

Overview

 
  • Thermal Field Emission SEM with Variable Pressure Technology
  • Environmental Secondary Electron Detector (ESED) Option
  • Analytical Chamber Available for Simultaneous CL, EDX, WDS and EBSD Analysis
  • High Resolution Observation of Wet, Oily, Dirty or Non-Conductive Samples
  • Ideal for Dynamic Experiments

The S-4300SE/N combines the benefits of a Schottky Field Emission gun, Variable Pressure technology and Hitachi’s ESED imaging capability. When operating in Variable Pressure mode, the S-4300SE/N provides high-resolution images of all types of insulating materials or biological samples. The S-4300SE/N’s optional chamber design provides a superior analytical configuration to optimize the performance of CL, EDX, WDS, and EBSD applications. High current and stability make the S-4300SE/N ideal for Electron Beam Lithography and other dynamic experiments.

 
 
starting of secondary navigation
Electron Microscopes

Tabletop Microscopes

TM-1000 Tabletop Microscope

PCI Data Management System

Quartz PCI

Transmission Electron Microscopes

H-7650 120 kV Automatic TEM

H-9500 300kV TEM

HD-2300A UHR 200keV FE-STEM

HF-3300 300 kV FE TEM

Standard and Variable Pressure SEM

S-3700N Ultra Large VP-SEM

S-3400N Fully Automated VP SEM

Field Emission SEM

S-4300 SE/N Variable Pressure FE SEM

S-4300 Cold FE-SEM

S-4300 SE Analytical Schottky FE-SEM

S-5500 In-Lens FE SEM

S-4800 UHR FE-SEM

SU-70 UHR Schottky (Analytical) FE-SEM

Focused Ion Beam System

FB-2100 FIB System

Metrology Systems

CG4000 Scanning Electron Microscope

DesignGauge

Inspection & Review Systems

LS Unpatterned Wafer Inspection System

RS-Series Defect Review SEM

IS-Series Patterned Wafer Inspection System

starting of footer  | Site Map  | Terms of Use  |  Contact  |  Careers |

© 2002- Hitachi High Technologies America, Inc. All rights reserved.