VP SEM/FE SEM Short Courses

High Resolution Field Emission (FE) SEM Short Courses

Conducted by: Dr. David C. Joy, EM Facility Director, University of Tennessee, Knoxville and the staff of Hitachi High Technologies America Nano-Technology Department

Both courses include lecture and laboratory sessions pertaining to the principles of operation, basic design, and general maintenance of the Variable Pressure (VP) SEM system, Field Emission (FE) SEM and PCI image management system.

Dr. David Joy teaches the courses. Dr. Joy is a University of Tennessee and Oak Ridge National Laboratory Distinguished Scientist, a professor and Director of the EM Facility at the University of Tennessee, and a member of the Technical Staff in the Metals and Ceramics Division of ORNL. Previously, he was a member of the technical staff of AT&T Bell Labs, Murray Hill, NJ for fourteen years. He is active in the field of scanning electron microscopy with emphasis on high-resolution microscopy, device metrology, electron solid interaction and modeling, and analytical electron microscopy.

For further information, please contact Sam Ngak at (925) 218.2831or by email.

2008 VP-SEM Course Dates:

2008 CFE SEM Course Dates :

FE SEM 2008 Registration Form

VP SEM 2008 Registration Form