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Tech Notes

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VARIABLE PRESSURE STD SEM

	Low Voltage Imaging with Hitachi's S-3000 Series SEMs
	Variable Pressure Low-Voltage Imaging with Hitachi's S-3000
	Hitachi Backscatter Detector for S-3000 Series SEMs

FIELD EMISSION SEM

	Introduction of the S-4300SE SEM with Features and Some Applications (S-4300SE SEM 101)
	Feature of a New Electron Detector for the S-4700 and Some Initial Applications (S-4700 SEM 94)
	Charge Reduction of Photoresist with Hitachi's S-4700
	Low Voltage STEM Holder for Hitachi's S-4000 Series FE-SEM
	A New Evaluation Technique for Bulky Compound Materials (S-4700, FB-2000A SEM 90)
	High Resolution Cryogenic Microscopy Using the S-4700 FE-SEM (S-4700 SEM 96)
	Ultra Low Voltage Imaging with Hitachi's S-4800 FE-SEM
	Low Voltage Transmission Imaging with Hitachi's S-4800 FE-SEM
	The S-5200 Ultra-High Resolution FE SEM (S-5200 SEM 98)
	STEM Image Observation Using the S-5200 UHR FE-SEM (S-5200, FB-2000A SEM 100)
	Electron Microscopy of Compound Materials Using Low Voltage STEM Mode (S-5200 SEM 103)
	Microscopy of Biological Sections using a Low Voltage STEM Technique (S-5200 SEM 102)

TEM

	Imaging Gas-Solid Interactions in an Atomic Resolution Environmental TEM
	Development of the H-7600 and Some Initial Applications using the Auto-Focus Function (H-7600 TEM 108)
	Three Dimensaional Observation of Functional Protein (H-7600 TEM 119)
	Development of an Automated Particle Search System for the H-7600 TEM and some Applications (H-7600 TEM 111)
	Use of Image Database in Bio-Medical Field (H-7600 TEM 115)
	High Temperature and High Resolution Observation EELS Analysis (HF-2200 TEM 114)
	High Temperature In-Situ Microscopy and EELS Spectroscopy of a Metal Precipitate (HF-2000 TEM 109)
	High Resolution Electron Microscopy of Carbon Nano-Tube at room and High 8. Temperatures (HF-2200 TEM 112)
	Structure Analysis of Fine Precipitates in Metals Using an FIB-TEM (HF-2200, FB-2000A TEM 110)

STEM

	An Application of the HD-2000 To Materials Characterization of Catalyst (HD-2000 STEM 1)
	Microscopic Analysis of GMR Head using the HD-2000 (HD-200, FB-2000A STEM 2)
	64M-DRAM Viewed using the HD-2000(HD-2000 & FB-2000A TEM 103)
	Applications of a New Micro-Sampling Technique for Metal Specimen Preparation (FB-2000, HD-2000 STEM 3)
	Electron Diffraction Image Observation Attachment (HD-2000 STEM 4)
	Analysis of Barrier Metal Layers of SI-Devices (HD-2000 5)
	Preparation of Biological Tissue Sections using FIB (FB-2000A, HD-2000 STEM 6)
	Imaging of Biological Thin Sections HD-2000
	Site-Specific 3 Dimensional Characterization Using an FIB Micro-Sampling Technique (FB-2000A, HD2000, HF-2200 STEM 7)
	3-D Observation of Materials with Hitachi's HD-2000
	FIB-STEM System 3-D Observation of Resin-Embedded Yeast Cell

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