Library

Technical Notes

• 3-D Observation of Materials with Hitachi's HD-2000
  Electron Microscopes and Focused Ion Beam
• 64M-DRAM Viewed using the HD-2000
  Electron Microscopes and Focused Ion Beam
• A New Evaluation Technique for Bulky Compound Materials
  Field Emission SEM
• An Application of the HD-2000 To Materials Characterization of Catalyst
  Electron Microscopes and Focused Ion Beam
• Analysis of Barrier Metal Layers of SI-Devices
  Electron Microscopes and Focused Ion Beam
• Applications of a New Micro-Sampling Technique for Metal Specimen Preparation
  Electron Microscopes and Focused Ion Beam
• Charge Reduction of Photoresist with Hitachi's S-4700
  Field Emission SEM
• Contamination Cleaning of TEM/SEM Samples with the ZONE Cleaner
  Sample Preparation
• Development of an Automated Particle Search System for the H-7600 TEM and some Applications
  Transmission Electron Microscopes
• Development of the H-7600 and Some Initial Applications using the Auto-Focus Function
  Transmission Electron Microscopes
• Electron Diffraction Image Observation Attachment
  Electron Microscopes and Focused Ion Beam
• Electron Microscopy of Compound Materials Using Low Voltage STEM Mode
  Field Emission SEM
• Environmental Transmission Electron Microscope (E-TEM)
  Transmission Electron Microscopes
• Feature of a New Electron Detector for the S-4700 and Some Initial Applications
  Field Emission SEM
• FIB-STEM System 3-D Observation of Resin-Embedded Yeast Cell
  Electron Microscopes and Focused Ion Beam
• High Resolution Cryogenic Microscopy Using the S-4700 FE-SEM
  Field Emission SEM
• High Resolution Electron Microscopy of Carbon Nano-Tube at room and High 8. Temperatures
  Transmission Electron Microscopes
• High Temperature and High Resolution Observation EELS Analysis
  Transmission Electron Microscopes
• High Temperature In-Situ Microscopy and EELS Spectroscopy of a Metal Precipitate
  Transmission Electron Microscopes
• Hitachi Backscatter Detector for S-3000 Series SEMs
  Electron Microscopes and Focused Ion Beam
• Imaging Gas-Solid Interactions in an Atomic Resolution Environmental TEM
  Transmission Electron Microscopes
• Imaging of Biological Thin Sections HD-2000
  Electron Microscopes and Focused Ion Beam
• Introduction of the S-4300SE SEM with Features and Some Applications
  Field Emission SEM
• Low Voltage STEM Holder for Hitachi's S-4000 Series FE-SEM
  Field Emission SEM
• Low Voltage Transmission Imaging with Hitachi's S-4800 FE-SEM
  Field Emission SEM
• Microscopic Analysis of GMR Head using the HD-2000
  Electron Microscopes and Focused Ion Beam
• Microscopy of Biological Sections using a Low Voltage STEM Technique
  Field Emission SEM
• Preparation of Biological Tissue Sections using FIB
  Electron Microscopes and Focused Ion Beam
• Research at Room Temperature with Hitachi Model HF3300 FE-TEM
  Transmission Electron Microscopes
• Site-Specific 3 Dimensional Characterization Using an FIB Micro-Sampling Technique
  Electron Microscopes and Focused Ion Beam
• STEM Image Observation Using the S-5200 UHR FE-SEM
  Field Emission SEM
• Structure Analysis of Fine Precipitates in Metals Using an FIB-TEM
  Transmission Electron Microscopes
• The S-5200 Ultra-High Resolution FE SEM
  Field Emission SEM
• Three Dimensional Observation of Functional Protein
  Transmission Electron Microscopes
• Ultra Low Voltage Imaging with Hitachi's S-4800 FE-SEM
  Field Emission SEM
• Use of Image Database in Bio-Medical Field
  Transmission Electron Microscopes
• Variable Pressure Low-Voltage Imaging with Hitachi's S-3000
  Electron Microscopes and Focused Ion Beam