Booth #: 109-111

Enrich your career at the 36th International Symposium for Testing and Failure Analysis, November 14-18 in Dallas, Texas. Acquire the latest knowledge from the field's leading professionals with six days of tutorials, short courses, technical presentations, panels, and user groups. Research leading edge instruments and solutions at the industry's largest dedicated equipment expo. Meet and network with hundreds of your peers from novice to expert.

Hitachi will have on display the latest NB5000 SEM/FIB system (mock-up), Zone Cleaner (sample preparation system), E-3500 Ion Milling Cross Sectioning system and the new TM3000 Table Top SEM with EDS.

Visit the show web site at: http://asmcommunity.asminternational.org/content/Events/istfa/