The Hitachi 3-day VPSEM advanced training course will discuss the principles of operation, basic design and concepts of the Variable Pressure SEM system. Lectures and laboratory sessions will be conducted by Dr. David Joy and the Hitachi Advanced Applications staff. In-lab sessions will demonstrate the principles discussed in the lectures with emphasis placed on optimizing the system for variable pressure, high resolution and energy dispersive x-ray microanalysis conditions using the Hitachi S-3400N VPSEM, SU6600 VP FESEM and Oxford INCA Energy Microanalysis system. Sessions on sample preparation and general maintenance of the instrument will also be covered.

Dr. Joy is a University of Tennessee-Knoxville and Oak Ridge National Laboratory Distinguished Scientist, a professor and Director of the EM Facility at the University of Tennessee-Knoxville. Previously he was a member of the technical staff of AT&T Bell Labs, Murray Hill, NJ. He is active in the field of scanning electron microscopy with emphasis on high-resolution microscopy, device metrology, electron solid interaction and modeling and analytical electron microscopy.

3-day course tuition fee – $995

Register NOW at  http://www.regonline.com/hitachivpsemtraining.

Please enroll early as space is limited in a effort to keep the class size to a minimum.